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Research article

First published 2013-1

Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization

Enric Garcia-Caurel, Antonello De Martino, Jean-Paul Gaston [...]

Applied Spectroscopy

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Research article

First published 2009-8

Spectroscopic Ellipsometry of Mucin Layers on an Amphiphilic Diblock Copolymer Surface

Nataliya A. Nikonenko, Braheem A. Bushnak, Joseph L. Keddie

Applied Spectroscopy

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Research article

First published 1993-2

Ellipsometric Study of Critical-Angle Infrared ATR Spectroscopy with a Metal-Coated Elastomer Film Overlayer

Atsuo Watanabe

Applied Spectroscopy

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Research article

First published 1979-3

Reflection-Absorption Infrared Spectroscopy and Ellipsometry of Epoxy Films on Metals

F. J. Boerio, S. L. Chen

Applied Spectroscopy

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Research article

First published 2005-1

Optical Characterization of Varnish Films by Spectroscopic Ellipsometry for Application in Artwork Conservation

Kyriaki Polikreti, Andreas Othonos, Constantinos Christofides

Applied Spectroscopy

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Research article

First published 2024-4

Measurement of the Optical Constants of Sand Samples Using Ellipsometry on Sand–Adhesive Composites

Jesse A. Frantz, Matthew B. Hart, Cobey L. McGinnis [...]

Applied Spectroscopy

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Research article

First published 2003-10

Fourier Transform Infrared Synchrotron Ellipsometry for Studying the Anisotropy of Small Organic Samples

K. Hinrichs, M. Gensch, A. Röseler [...]

Applied Spectroscopy

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Research article

First published 2007-9

Ellipsometric Advances for Local Surface Plasmon Resonance to Determine Chitosan Adsorption on Layer-By-Layer Gold Nanoparticles

Yen Hsun Su, Lay Gaik Teoh, Wei Hao Lai [...]

Applied Spectroscopy

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Research article

First published 2019-3

Treatment of Surface Plasmon Resonance (SPR) Background in Total Internal Reflection Ellipsometry: Characterization of RNA Polymerase II Film Formation

Dušan Hemzal, Yu Ri Kang, Jan Dvořák [...]

Applied Spectroscopy

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Research article

First published 1998-12

Ellipsometric characterisation of ordered Ga 0.5 In 0.5 P

F. Alsina, M. Garriga, M. I. Alonso [...]

Materials Science and Technology

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