High performance time-of-flight secondary ion mass spectrometry (TOF-SIMS) characterised by high mass resolution and extreme sensitivity has been applied to the analysis of fullerenes. Optimum emission of secondary ions is obtained from silver substrates covered by approximately one monolayer of fullerene. Besides the intact cluster ions C60+, C70+ and C84+ the positive ion TOF-SIMS spectrum is characterised by peaks which contain silver, oxygen or hydrogen attached to fullerenes (C60Ag+, C70Ag+, (C60)2Ag+, C60O+, C70O+, C60Hn+ and C70Hn+). The spectrum of negative secondary ions shows that negative ion TOF-SIMS exhibits increased sensitivity for large fullerenes such as C84.
Get full access to this article
View all access options for this article.
References
1.
TaylorR.HareJ.P.Abdul-SadaA.K. and KrotoH.W., J. Chem. Soc., Chem. Comm.20, 1423 (1990).
2.
KrätschmerW.LambL.D.FostiropoulosK. and HuffmanD.R., Nature347, 354 (1990).
3.
MalhotraR. and RossD.S., J. Phys. Chem.95, 4599 (1991).
4.
JinnoK.UemuraT.NagashimaH. and ItohK., Chromatographia35(1/2), 38 (1993).
5.
UlmerG.CampbellE.E.B.KühnleR.BusmannH.G. and HertelI.V., Chem. Phys. Letters182(2), 114 (1991).
6.
BenninghovenA.HagenhoffB. and NiehuisE., Anal. Chem.65, 630 (1993).
7.
van LeyenD.HagenhoffB.NiehuisE.BenninghovenA.BletssI.V. and HerculesD.M., J. Vac. Sci. Technol.A7(3), 1790 (1989).
8.
ZimmermanP.A. and HerculesD.M., Appl. Spectrosc.47, 1545 (1993).
9.
HéroldC.BéginD.MarêchéJ.F.LelaurainM. and ZharikovO.V., Solid State Comm.89(2), 131 (1994).
10.
UlmerG.CampbellE.E.B.KühnleR.BusmannH.G. and HertelI.V., Chem. Phys. Letters182, 114 (1991).
11.
KrätschmerW., Z. Phys. D., Atoms, Molecules and Clusters19, 405 (1991).
12.
WilsonR.G.StevieF.A. and MageeC.W., Secondary Ion Mass Spectrometry.John Wiley, New York (1989).
13.
SchmalzT.G.SeitzW.A.KleinD.J. and HiteG.E., J. Am. Chem. Soc.110, 1113 (1988).
14.
BenninghovenA.RüdenauerF.G. and WernerH.W., Secondary Ion Mass Spectrometry.John Wiley, New York (1987).
15.
BenninghovenA., J. Vac. Sci. Technol.A3(3)
, 451 (1985).
