The implementation of an algorithm to build test sequences to diagnose stuck-at type faults and bridge-faults in asynchronous sequential circuits is presented in this paper. Every path of signal flow (including the feedback wires) is enumerated in the circuit. An algebraic expansion method is used to sensitize each enumerated path in order to send the binary signals along the path, unimpeded at any gate, to the primary output of the path. A present sequence is built to fix the feedback wires in each path at the values required to sensitize the path. The algorithm will yield test sequences to detect and locate all the multiple stuck-at type faults and bridge-faults. The algorithm is implemented by storing the circuit description in a data structure. All the paths are enumerated using the information in the data structure and the test sequences are built by sensitizing the enumerated paths. Fault dictionary for the circuit is built from single fault ranges of the test sequences.
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